Elastic Property of Vertically Aligned Nanowires
An atomic force microscopy (AFM) based technique is demonstrated for measuring the elastic modulus of individual nanowires/nanotubes aligned on a solid substrate without destruc...
Publications
1 shownFrequent Co-Authors
Researcher Info
- h-index
- 1
- Publications
- 1
- Citations
- 293
- Institution
- Georgia Institute of Technology
External Links
Identifiers
- ORCID
- 0000-0002-2423-8801
Impact Metrics
h-index
1
h-index: Number of publications with at least h citations each.