EW Van Stryland - Researcher Profile

Publications

2 shown

Two-Photon Absorption, Nonlinear Refraction and Optical Limiting in Semiconductors

EW Van Stryland , H Vanherzeele , MA Woodall +4 more

Two-photon absorption coefficients β2 of eight different semiconductors with bandgap energy Eg varying between 1.4 and 3.7 eV are measured using 1.06 μm and 0.53 μm picosecond p...

1986 39 citations

Simple Direct Measurements of n2

WE Williams , M. J. Soileau , EW Van Stryland

A simple direct method for measurements of n2 is described. The method involves measurements of beam distortions in the transmitted, time-integrated spatial profile using an opt...

1985 3 citations

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Researcher Info

h-index: 2
Publications: 2
Citations: 42
Institution: Texas State University

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Impact Metrics

h-index 2

h-index: Number of publications with at least h citations each.