Abstract
Spin-polarized low-energy electron diffraction is applied for the first time to study the coupling between ferromagnetic and antiferromagnetic ultrathin films. The remanent magnetization for the epitaxial double-layer structure ${\mathrm{Fe}}_{\mathrm{ii}}$/Cr/${\mathrm{Fe}}_{\mathrm{i}}$/Cr(100) has been monitored in situ during growth. The two Fe slabs (${\mathrm{Fe}}_{\mathrm{ii}}$, ${\mathrm{Fe}}_{\mathrm{i}}$) separated by a thin Cr layer show in-plane antiparallel magnetic coupling along the external magnetic field direction when the two Fe-layer thicknesses differ. The measurements suggest a 90\ifmmode^\circ\else\textdegree\fi{} rotation of the antiparallel magnetization for equal Fe-layer thicknesses.
Keywords
MagnetizationCondensed matter physicsAntiparallel (mathematics)Materials scienceFerromagnetismAntiferromagnetismCoupling (piping)RemanenceEpitaxyLayer (electronics)CrystallographyMagnetic fieldPhysicsNanotechnologyChemistry
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Publication Info
- Year
- 1987
- Type
- article
- Volume
- 36
- Issue
- 4
- Pages
- 2433-2435
- Citations
- 181
- Access
- Closed
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Cite This
C. Carbone,
S. F. Alvarado
(1987).
Antiparallel coupling between Fe layers separated by a Cr interlayer: Dependence of the magnetization on the film thickness.
Physical review. B, Condensed matter
, 36
(4)
, 2433-2435.
https://doi.org/10.1103/physrevb.36.2433
Identifiers
- DOI
- 10.1103/physrevb.36.2433