Bayesian contrastive Learning: An augmentation-free fault diagnosis method with limited labels and uncertainty quantification
Hassaan Ahmad
,
Wei Cheng
,
Wentao Wang
,
Hassaan Ahmad
,
Wei Cheng
,
Wentao Wang
,
Li Liu
,
Zhibin Wei
,
Shuo Zhang
,
Zelin Nie
,
Jiangkun Yang
,
Xuefeng Chen
2025
Advanced Engineering Informatics
0 citations