Abstract

A simple yet highly reproducible method to suppress contamination of graphene at low temperature inside the cryostat is presented. The method consists of applying a current of several milliamperes through the graphene device, which is here typically a few microns wide. This ultrahigh current density is shown to remove contamination adsorbed on the surface. This method is well suited for quantum electron transport studies of undoped graphene devices, and its utility is demonstrated here by measuring the anomalous quantum Hall effect.

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Publication Info

Year
2007
Type
article
Volume
91
Issue
16
Citations
598
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Cite This

J. Moser, A. BARREIRO, A Bächtold (2007). Current-induced cleaning of graphene. Applied Physics Letters , 91 (16) . https://doi.org/10.1063/1.2789673

Identifiers

DOI
10.1063/1.2789673
arXiv
0709.0607

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Data completeness: 79%