Electron emission measurements and the defect structure of ?-Al2O3

P. Odier; J. C. Rifflet; J.P. Loup

doi:10.1007/bf01058088

Keywords

Materials sciencePartial pressureWork functionCrystalliteDopingFermi levelImpurityAcceptorElectronAtmospheric temperature rangeAnalytical Chemistry (journal)OxygenCondensed matter physicsLayer (electronics)NanotechnologyChemistryThermodynamicsMetallurgyOptoelectronicsPhysics

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Publication Info

Year: 1984
Type: article
Volume: 19
Issue: 7
Pages: 2121-2135
Citations: 8
Access: Closed

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APA Style

                            
                                    P. Odier, 
                                
                                    J. C. Rifflet, 
                                
                                    J.P. Loup
                                
                            (1984). 
                            Electron emission measurements and the defect structure of ?-Al2O3. 
                            Journal of Materials Science
                            , 19
                            (7)
                            , 2121-2135.
                            https://doi.org/10.1007/bf01058088

Identifiers

DOI: 10.1007/bf01058088