High-resolution broadband characterization of resonance dispersion in an optical microresonator

Abstract

Accurate knowledge of the uneven free spectral range of an optical microresonator, which provides direct insight into group velocity dispersion, is essential for understanding and controlling Kerr frequency comb dynamics. In this work, we present a simple and highly precise method formeasuring the free spectral range over a 5 THz bandwidth in silicon nitride microresonators, leveraging a wavemeter with 0.4 MHz resolution. Our fully fibered plug-and-play experimental setup enables the accurate extraction of resonance frequencies. By carefully analyzing the spectral position of each resonance, we measure both second- and third-order free spectral range expansion coefficients. This approach offers a robust and accessible tool for dispersion characterization in integrated photonic circuits, paving the way for next-generation of Kerr comb sources and quantum photonic technologies.

Affiliated Institutions

• Institut polytechnique de Grenoble FR
• CEA LETI FR
• Institut de Physique de Nice FR
• CEA Grenoble FR
• Centre de Nanosciences et de Nanotechnologies FR
• Commissariat à l'Énergie Atomique et aux Énergies Alternatives FR

Related Publications