High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy

Keywords

OverfittingNoise (video)Resolution (logic)Image resolutionArtificial intelligenceComputer scienceAlgorithmComputer visionImage (mathematics)

Affiliated Institutions

MRC Laboratory of Molecular Biology GB

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Publication Info

Year: 2013
Type: article
Volume: 135
Pages: 24-35
Citations: 1030
Access: Closed

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APA Style

                            
                                    Shaoxia Chen, 
                                
                                    Greg McMullan, 
                                
                                    A.R. Faruqi
                                
                                et al.
                            
                            (2013). 
                            High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy. 
                            Ultramicroscopy
                            , 135
                            
                            , 24-35.
                            https://doi.org/10.1016/j.ultramic.2013.06.004

Identifiers

DOI: 10.1016/j.ultramic.2013.06.004