Abstract

A numerical method for the analysis of the absorption spectrum and the refractive index change due to an external electric field in quantum-well structures is presented. The finite-element method and the variational method are used to obtain the subband and the exciton energies in a quantum-well structure, respectively. The absorption spectrum due to the band-to-band and the excitonic transitions is then calculated, and the refractive index change is obtained using the Kramers-Kronig relations. This method is applicable to quantum-well structures with arbitrary potential profiles made of arbitrary semiconductors, because it is based on the finite-element method in which the general boundary condition for the heterointerface is employed. The validity of the method is confirmed by comparing the computed results with the measured ones.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Keywords

Refractive indexSemiconductorOpticsAbsorption (acoustics)OptoelectronicsSemiconductor laser theoryNumerical analysisMaterials sciencePhysicsMathematics

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Publication Info

Year
1992
Type
article
Volume
28
Issue
7
Pages
1670-1677
Citations
49
Access
Closed

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Kenji Nakamura, Akira Shimizu, K. Fujii et al. (1992). Numerical analysis of the absorption and the refractive index change in arbitrary semiconductor quantum-well structures. IEEE Journal of Quantum Electronics , 28 (7) , 1670-1677. https://doi.org/10.1109/3.142554

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DOI
10.1109/3.142554