Abstract
Presented here is an overview of the present status and future prospects of scanning tunneling microscopy. Topics covered include the physical basis of the scanning tunneling microscope, its instrumentation aspects, and its use for structural and spectroscopic imaging—on a scale which extends to atomic dimensions. Associated experimental and theoretical studies are reviewed, including several which suggest potential applicability of this new type of microscope to a relatively broad range of biological, chemical, and technological areas.
Keywords
Scanning tunneling microscopeScanning probe microscopyNanotechnologyMicroscopeMicroscopyMaterials scienceInstrumentation (computer programming)Electrochemical scanning tunneling microscopeScanning tunneling spectroscopyOpticsComputer sciencePhysics
Affiliated Institutions
Related Publications
The flexible and modern open source scanning probe microscopy software package <scp>GXSM</scp>
GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used both in stand alone mode for powerful image processing and analysis and connected to ...
Atomic Structure of Graphene on SiO<sub>2</sub>
We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e., a graphene sheet supported by an insulating ...
Atomic Structure of Graphene on SiO2
We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e., a graphene sheet supported by an insulating ...
Atomic and Molecular Manipulation with the Scanning Tunneling Microscope
The prospect of manipulating matter on the atomic scale has fascinated scientists for decades. This fascination may be motivated by scientific and technological opportunities, o...
7 × 7 Reconstruction on Si(111) Resolved in Real Space
The 7 \ifmmode\times\else\texttimes\fi{} 7 reconstruction on Si(111) was observed in real space by scanning tunneling microscopy. The experiment strongly favors a modified adato...
Publication Info
- Year
- 2000
- Type
- article
- Volume
- 44
- Issue
- 1.2
- Pages
- 279-293
- Citations
- 336
- Access
- Closed
External Links
Social Impact
Altmetric
PlumX Metrics
Social media, news, blog, policy document mentions
Citation Metrics
336
OpenAlex
1
Influential
96
CrossRef
Cite This
G. Binnig,
H. Rohrer
(2000).
Scanning tunneling microscopy.
IBM Journal of Research and Development
, 44
(1.2)
, 279-293.
https://doi.org/10.1147/rd.441.0279
Identifiers
- DOI
- 10.1147/rd.441.0279