Abstract
Lateral resolution that exceeds the classical diffraction limit by a factor of two is achieved by using spatially structured illumination in a wide‐field fluorescence microscope. The sample is illuminated with a series of excitation light patterns, which cause normally inaccessible high‐resolution information to be encoded into the observed image. The recorded images are linearly processed to extract the new information and produce a reconstruction with twice the normal resolution. Unlike confocal microscopy, the resolution improvement is achieved with no need to discard any of the emission light. The method produces images of strikingly increased clarity compared to both conventional and confocal microscopes.
Keywords
Resolution (logic)ConfocalOpticsMicroscopeMicroscopyLight sheet fluorescence microscopyConfocal microscopyDiffractionMaterials scienceImage resolutionScanning confocal electron microscopyPhysicsComputer scienceArtificial intelligence
Affiliated Institutions
Related Publications
Probing Individual Molecules with Confocal Fluorescence Microscopy
Confocal fluorescence microscopy coupled with a diffraction-limited laser beam and a high-efficiency detection system has been used to study the diffusive movement and emission ...
Single Molecules Observed by Near-Field Scanning Optical Microscopy
Individual carbocyanine dye molecules in a sub-monolayer spread have been imaged with near-field scanning optical microscopy. Molecules can be repeatedly detected and spatially ...
Imaging of single molecule diffusion.
In recent years observations at the level of individual atoms and molecules became possible by microscopy and spectroscopy. Imaging of single fluorescence molecules has been ach...
The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
Atomic Imaging Within Adsorbed Molecules Scanning tunneling microscopy provides atomic resolution images of surfaces and adsorbed atoms, but imaging atoms within an organic mole...
Evaluation of the Phase Contrast Microscopy Method for the Detection of Fibrous and Other Elongated Mineral Particulates by Comparison With a STEM Technique
The USPHS/NIOSH Membrane Filter Method is used to monitor for asbestos in occupational and mining atmospheres, and employs the phase-contrast optical microscope (PCM) that under...
Publication Info
- Year
- 2000
- Type
- article
- Volume
- 198
- Issue
- 2
- Pages
- 82-87
- Citations
- 3670
- Access
- Closed
External Links
Social Impact
Altmetric
PlumX Metrics
Social media, news, blog, policy document mentions
Citation Metrics
3670
OpenAlex
Cite This
Mats G. Gustafsson
(2000).
Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy.
Journal of Microscopy
, 198
(2)
, 82-87.
https://doi.org/10.1046/j.1365-2818.2000.00710.x
Identifiers
- DOI
- 10.1046/j.1365-2818.2000.00710.x