Abstract
ABSTRACT Some methods are presented for estimating the reliability of a partially speeded test without the use of a parallel form. The effect of these formulas on some test data is illustrated. Whenever an odd‐even reliability is computed, it is probably desirable to use one of the formulas noted in Section 2 of this paper in addition to the usual Spearman‐Brown correction. Since the formulas given here involve the mean and standard deviation of the “number unattempted score”, a method is given in Section 4 for computing this mean and standard deviation from item analysis data. If the item analysis data are available, this method will save considerable time as compared with rescoring answer sheets.
Keywords
Reliability (semiconductor)Standard deviationSection (typography)StatisticsTest (biology)Computer scienceAbsolute deviationTest dataMathematicsAlgorithm
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Publication Info
- Year
- 1950
- Type
- article
- Volume
- 1950
- Issue
- 1
- Pages
- 259-69
- Citations
- 29
- Access
- Closed
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Cite This
Harold Gulliksen
(1950).
THE RELIABILITY OF SPEEDED TESTS.
ETS Research Bulletin Series
, 1950
(1)
, 259-69.
https://doi.org/10.1002/j.2333-8504.1950.tb00876.x
Identifiers
- DOI
- 10.1002/j.2333-8504.1950.tb00876.x