Abstract
An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.
Keywords
Materials scienceAmorphous solidThermal conductivityDielectricThermal conductivity measurementConductivityThermalAnalytical Chemistry (journal)Composite materialOpticsOptoelectronicsThermodynamicsCrystallographyChemistryPhysicsChromatographyPhysical chemistry
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Publication Info
- Year
- 1990
- Type
- article
- Volume
- 61
- Issue
- 2
- Pages
- 802-808
- Citations
- 1815
- Access
- Closed
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Cite This
David G. Cahill
(1990).
Thermal conductivity measurement from 30 to 750 K: the 3ω method.
Review of Scientific Instruments
, 61
(2)
, 802-808.
https://doi.org/10.1063/1.1141498
Identifiers
- DOI
- 10.1063/1.1141498