Keywords

IonAtomic physicsElectronProjectileSecondary electronsRange (aeronautics)Cluster (spacecraft)Kinetic energySecondary emissionAtom (system on chip)Lattice (music)Materials sciencePhysicsNuclear physics

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Publication Info

Year
1980
Type
article
Volume
170
Issue
1-3
Pages
309-315
Citations
111
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Closed

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R. J. Beuhler, L. Friedman (1980). Threshold studies of secondary electron emission induced by macro-ion impact on solid surfaces. Nuclear Instruments and Methods , 170 (1-3) , 309-315. https://doi.org/10.1016/0029-554x(80)91031-9

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DOI
10.1016/0029-554x(80)91031-9