Abstract
Testing complex manufacturing systems, like the ASML TWINSCAN [2] lithographic\nmachine, takes a lot of time and costs. Within the Tangram project,\nmethods are investigated to reduce this test costs. In this article, we describe\na method which is used to optimize a test sequence such that it takes the least\namount of costs, or time. With several cases we demonstrate that this method\ncan be used to optimize test sequences within the manufacturing of a TWINSCAN\nlithographic machine such that cycle time is reduced.
Keywords
Affiliated Institutions
Related Publications
Conceptual and design thinking for thematic analysis.
Thematic analysis (TA) is widely used in qualitative psychology. In using TA, researchers must choose between a diverse range of approaches that can differ considerably in their...
When to use and how to report the results of PLS-SEM
Purpose The purpose of this paper is to provide a comprehensive, yet concise, overview of the considerations and metrics required for partial least squares structural equation m...
Global environmental change and health: impacts, inequalities, and the health sector
Human actions are changing many of the world’s natural environmental systems, including the climate system. These systems are intrinsic to life processes and fundamental to huma...
Conscious Contents Provide the Nervous System with Coherent, Global Information
The online version contains supplementary material available at 10.1007/s12237-025-01609-x.
Publication Info
- Year
- 1978
- Type
- article
- Volume
- 36
- Issue
- 4
- Pages
- 405-417
- Citations
- 598
- Access
- Closed
External Links
Social Impact
Social media, news, blog, policy document mentions
Citation Metrics
Cite This
Identifiers
- DOI
- 10.1037//0022-3514.36.4.405