Abstract

p-type HgTe/Hg0.3Cd0.7Te(001) quantum wells (QWs) have been grown with molecular-beam epitaxy (MBE) on Cd0.96Zn0.04Te substrates using modulation doping techniques. Both plasma-excited nitrogen and evaporated cadmium arsenide have been utilized for in situ doping during MBE growth. A comparison of the electrical and structural properties of QWs fabricated by the two doping techniques has been made. Two-dimensional hole concentrations in nitrogen-doped QWs (up to 1.0×1012 cm−2) were significantly higher than in arsenic-doped QWs (below 0.5×1012 cm−2). However, by means of a gate-controlled Hall bar, hole densities up to 1.1×1012 cm−2 have been achieved in the latter system. Hall mobilities up to 1.0×105 cm2/(V s) have been measured. Whereas all samples exhibit pronounced although irregular Shubnikov–de Haas oscillations, quantum Hall plateaus in the arsenic-doped samples are broader and better defined.

Keywords

Molecular beam epitaxyQuantum wellArsenicDopingHall effectShubnikov–de Haas effectGallium arsenideChemistryCondensed matter physicsMaterials scienceAnalytical Chemistry (journal)EpitaxyOptoelectronicsElectrical resistivity and conductivityNanotechnologyOpticsPhysicsQuantum oscillationsSuperconductivityMetallurgy

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Publication Info

Year
2001
Type
article
Volume
79
Issue
24
Pages
3980-3982
Citations
9
Access
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K. Ortner, X. C. Zhang, S. Oehling et al. (2001). Growth and characterization of <i>p</i>-type HgTe/Hg1−xCdxTe single quantum wells using nitrogen and arsenic. Applied Physics Letters , 79 (24) , 3980-3982. https://doi.org/10.1063/1.1425465

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DOI
10.1063/1.1425465