Keywords
Scanning transmission electron microscopyResolution (logic)High-resolution transmission electron microscopyTilt (camera)Electron energy loss spectroscopySpectroscopyImage resolutionField emission gunElectronChemistryEnergy filtered transmission electron microscopyElectron microscopeMaterials scienceOpticsAnalytical Chemistry (journal)Transmission electron microscopyNanotechnologyPhysics
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Publication Info
- Year
- 1999
- Type
- article
- Volume
- 78
- Issue
- 1-4
- Pages
- 125-139
- Citations
- 232
- Access
- Closed
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Cite This
E. M. James,
Nigel D. Browning
(1999).
Practical aspects of atomic resolution imaging and analysis in STEM.
Ultramicroscopy
, 78
(1-4)
, 125-139.
https://doi.org/10.1016/s0304-3991(99)00018-2
Identifiers
- DOI
- 10.1016/s0304-3991(99)00018-2