Simple Direct Measurements of n2
1985
3 citations
Abstract
A simple direct method for measurements of n2 is described. The method involves measurements of beam distortions in the transmitted, time-integrated spatial profile using an optical multichannel analyzer. A model is described which allows extraction of n2 from fits of experiment to computer generated theoretical spatial profiles. The results for picosecond pulses at 1.06 μm and 0.53 μm are presented for three materials: fused quartz, NaCl, and CS2. Little dispersion in n2 is seen for each material over the wavelength range studied.
Keywords
PicosecondOpticsMaterials scienceDispersion (optics)Spectrum analyzerSimple (philosophy)WavelengthRange (aeronautics)Spatial dispersionPhysicsLaser
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Publication Info
- Year
- 1985
- Type
- book-chapter
- Pages
- 522-531
- Citations
- 3
- Access
- Closed
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Cite This
WE Williams,
M. J. Soileau,
EW Van Stryland
(1985).
Simple Direct Measurements of n2.
, 522-531.
https://doi.org/10.1520/stp29007s
Identifiers
- DOI
- 10.1520/stp29007s