J. V. Dalton

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Far-Infrared Cyclotron Resonance in the Inversion Layer of Silicon

S. J. Allen , D. C. Tsui , J. V. Dalton

Cyclotron resonance in the $n$-type inversion layer of silicon has been observed at 4.2\ifmmode^\circ\else\textdegree\fi{}K for electron densities between (0.38 and 9.0) \ifmmod...

1974 Physical Review Letters 91 citations

Frequent Co-Authors

S. J. Allen

Nokia (United States)

D. C. Tsui

Researcher Info

h-index: 1
Publications: 1
Citations: 91

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h-index 1

h-index: Number of publications with at least h citations each.