Jumping mode scanning force microscopy
In this letter, we present a new scanning probe microscopy mode, jumping mode, which allows the simultaneous measurement of the topography and of some other physical property of...
Publications
3 shownScanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA molecules
We have developed a set of working modes for scanning probe microscopy (SPM), which generalizes the usual method of acquiring data. We call these modes three-dimensional (3D) mo...
Frequent Co-Authors
Researcher Info
- h-index
- 3
- Publications
- 3
- Citations
- 242
- Institution
- Universidad Autónoma de Madrid
External Links
Identifiers
- ORCID
- 0000-0003-2386-3186
Impact Metrics
h-index
3
h-index: Number of publications with at least h citations each.