Abstract

In this letter, we present a new scanning probe microscopy mode, jumping mode, which allows the simultaneous measurement of the topography and of some other physical property of the sample. Essentially, at each image point first the topography of the sample is measured during a feedback phase of a cycle, and then the tip–sample interaction is evaluated in real time as the tip is moved away and towards the sample. Since the lateral motion is done out of contact the method is free, or nearly free, of shear forces. The general advantages of jumping mode are discussed. Finally, two different applications of this mode are presented. In addition to the topography, the first application measures the adhesion between the tip and the sample, while the second determines the corresponding electrostatic interaction.

Keywords

JumpingSample (material)Scanning probe microscopyMode (computer interface)OpticsNon-contact atomic force microscopyMaterials sciencePhase (matter)Scanning Force MicroscopyNanotechnologyConductive atomic force microscopyAtomic force microscopyPhysicsComputer scienceGeology

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Publication Info

Year
1998
Type
article
Volume
73
Issue
22
Pages
3300-3302
Citations
177
Access
Closed

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Cite This

Pedro Pablo, J. Colchero, Julio Gómez‐Herrero et al. (1998). Jumping mode scanning force microscopy. Applied Physics Letters , 73 (22) , 3300-3302. https://doi.org/10.1063/1.122751

Identifiers

DOI
10.1063/1.122751