Abstract

Tip−sample interaction of an oscillating tip near a surface is determined. The experimental results show that the presence of the surface can be detected without mechanically touching the surface. By adjusting the appropriate operating conditions of a scanning force microscope setup, tip−sample contact can be avoided during imaging at atmospheric pressure. This allows study of even the softest samples. In the present work, we demonstrate that molecularly thin water films can be imaged with nanometer resolution on different substrates such as mica, gold, and highly oriented pyrolitic graphite. Correspondingly, scanning force microscopy can be used to investigate wetting properties of liquids with very high spatial resolution.

Keywords

MicaWettingScanning Force MicroscopyAdsorptionMaterials scienceScanning probe microscopyResolution (logic)Contact angleGraphiteNanometreMicroscopyScanning electron microscopeMicroscopeSolid surfaceAnalytical Chemistry (journal)Scanning ion-conductance microscopyNanotechnologyNon-contact atomic force microscopyAtomic force microscopyOpticsChemistryConductive atomic force microscopyComposite materialChromatographyScanning confocal electron microscopyChemical physics

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Publication Info

Year
2000
Type
article
Volume
16
Issue
11
Pages
5086-5092
Citations
62
Access
Closed

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Cite This

Adriana Gil, J. Colchero, Mónica Luna et al. (2000). Adsorption of Water on Solid Surfaces Studied by Scanning Force Microscopy. Langmuir , 16 (11) , 5086-5092. https://doi.org/10.1021/la9913304

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DOI
10.1021/la9913304